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    d*TREK is a flexible, customizable, device-independent software suite and toolkit which processes single crystal X-ray diffraction images from two-dimensional position sensitive detectors such as imaging plate area detectors and charged-coupled device (CCD) detectors. The ultimate result of the processing is a list of Bragg reflections which appear on those images with their Miller indices (hkl), estimated intensities, and standard deviations.


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Last modified: 12/27/06